Publications - Papers | Talks | Posters | Theses/Reports
2018
| A robust AFM-based method for locally measuring the elasticity of samples A. Bubendorf, S. Walheim, T. Schimmel and E. Meyer Beilstein J. Nanotechnol., 9, (2018), 1-10, pdf. |
2016
| Junction Barrier Schottky (JBS) Rectifier Interface Engineering Facilitated by Two-Dimensional (2D) Dopant Imaging H.R. Rossmann, U. Gysin, A. Bubendorf, T. Glatzel, S.A. Reshanov, A. Zhang, A. Schöner, T.A. Jung, E. Meyer and H. Bartolf Materials Science Forum, 858, (2016), 497-500, pdf. |
2015
| Two-Dimensional Carrier Profiling on Lightly Doped n-type 4H-SiC Epitaxially Grown Layers H. Rossmann, U. Gysin, A. Bubendorf, Th. Glatzel, S. Reshanov, A. Schöner, T. Jung, E. Meyer and H. Bartolf Material Science Forum, 821-823, (2015), 269-272, pdf. |
| Development of Power Semiconductors by Quantitative Nanoscale Dopant Imaging H. Bartolf, U. Gysin, H. Rossmann, A. Bubendorf, Th. Glatzel, T. Jung, E. Meyer, M. Zimmermann, S. Reshanov and A. Schoner IEEE 27th International Symposium on Power Semiconductor Dev, (2015), 281-284, pdf. |
2013
| Systematic study of the dolomite (104) surface by bimodal dynamic force microscopy in ultra-high vacuum S. Kawai, C. M Pina, A. Bubendorf, G. Fessler, T. Glatzel, E. Gnecco and E. Meyer Nanotechnology, 24, (5), (2013), 055702, pdf. |